The DFP-RM-200 is a high-precision Four Probe Set-Up specifically designed for advanced research applications in semiconductor and materials science. This research-grade model enables accurate and repeatable measurement of resistivity across a broad temperature range and under highly controlled experimental conditions.
It is ideal for temperature-dependent resistivity studies, band gap analysis, activation energy determination, and material characterization at the research level.
Precision-engineered four-point probe head with micro-positioning adjustment
Vacuum-compatible cryostat chamber for ultra-low temperature measurements (as low as 77 K with LN2)
High-temperature oven with programmable PID controller (ambient to ~300°C or more)
High-stability constant current source with fine control
High-resolution digital nanovoltmeter or PC-interfaceable data acquisition system
Compatible with thin films, wafers, and bulk semiconductor samples
Optional software support for real-time data logging, plotting, and analysis
Accurate resistivity measurement of semiconductors and nanomaterials
Band gap determination from temperature-resistivity graphs
Investigation of carrier transport mechanisms
Ideal for Ph.D. projects, scientific publications, and material development labs
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