The Four Probe Setup (DFP-LH) is a temperature-controlled resistivity measurement system designed for analyzing semiconductors across a wide temperature range, typically from liquid nitrogen temperatures (~77 K) up to 200°C or higher. This model is essential for advanced material research where temperature-dependent electrical properties are studied in detail.

Using the four-point probe technique, this setup provides highly accurate resistivity measurements by eliminating contact resistance. It is particularly suited for exploring activation energy, intrinsic vs extrinsic behavior, and semiconductor type determination.

🔧 Key Features:

• Integrated cryostat chamber for low-temperature measurements

• Heating oven with PID temperature controller (ambient to high temp)

• Precision four-point probe head with spring-loaded probes

• Constant current source with fine control

• Digital voltmeter or data acquisition system (optional)

• Suitable for Germanium, Silicon, and thin film samples

📚 Applications:

• Determination of resistivity as a function of temperature

• Calculation of band gap using activation energy

• Semiconductor type classification (n-type / p-type)

• Ideal for research labs, postgraduate projects, and advanced physics/electronics labs