The DFP-RM-200N is an advanced Four Probe Setup designed specifically for high-precision resistivity measurements of semiconductor and thin film materials at both low and high temperatures, with enhanced nitrogen cooling capability. The setup supports cryogenic-level testing (77 K) using liquid nitrogen, and is engineered for rigorous research and development (R&D) applications in physics, nanotechnology, and materials science.

This model provides highly sensitive, repeatable data for:

• Temperature-dependent resistivity studies

• Band gap analysis through activation energy calculation

• Characterization of new and exotic materials including nanomaterials

• Study of semiconducting behavior under extreme thermal conditions

🔧 Key Features:

• Advanced four-point probe head with spring-loaded, gold-plated probes

• Integrated liquid nitrogen-compatible cryostat for low-temp operation (~77 K)

• Precision heating system (ambient to ~300°C or more) with PID control

• High-resolution digital voltmeter/nanovoltmeter and stable current source

• Optional PC interface and software for real-time graphing and data acquisition

• Suitable for Si, Ge, thin films, wafers, and small bulk samples

• Fully shielded and low-noise design for enhanced accuracy

  Applications:

  • Resistivity vs. temperature analysis

  • Determination of semiconductor band gap

  • Nanomaterial electrical testing

  • Useful for Ph.D. research, scientific papers, and advanced physics labs