The HEX‑33 is a compact and efficient experimental setup for studying the Hall Effect in semiconductors. This model is designed for ease of use in academic laboratories and is suitable for undergraduate and postgraduate physics and electronics experiments.

Using a high-sensitivity Hall probe and a regulated power supply, the setup allows measurement of Hall voltage across a semiconductor sample in the presence of a magnetic field. With integrated digital voltmeter and ammeter, users can accurately calculate key semiconductor parameters such as Hall coefficient, carrier concentration, and mobility.

The system features a built-in Gaussmeter, making it a self-contained, bench-top solution ideal for physics labs.

🔧 Key Features

• High-sensitivity semiconductor Hall probe (Ge or GaAs)

• Integrated digital meters for voltage and current measurement

• Built-in Gaussmeter for magnetic field measurement

• Variable electromagnet power supply for magnetic field control

• Enables study of Hall voltage, carrier type, and carrier density

• Sturdy, compact setup for classroom and lab environments

   Applications

• Measurement of Hall voltage and Hall coefficient

• Determination of semiconductor type (n-type or p-type)

• Calculation of carrier concentration and mobility

• Study of Lorentz force on charge carriers in a magnetic field

• Teaching aid for solid-state physics and electronic materials