The Four Probe Method (Basic Model) (DFP-02) is a fundamental experimental setup used to measure the resistivity of semiconductor materials with high accuracy. Based on the four-point probe technique, this model is ideal for educational laboratories to introduce students to semiconductor physics, particularly the measurement of bulk resistivity and type of conduction in materials like Germanium or Silicon.

Key features include:

• High-quality four probe arrangement mounted on a rigid base

• Suitable for rectangular or wafer-type samples

• Built-in constant current source with adjustable output

• Digital voltmeter for precise voltage measurement between the inner probes

• Operates on the principle of eliminating contact resistance errors

• Compact, low-cost, and easy to operate — perfect for academic setups

The DFP-02 model enables the user to determine:

• Resistivity (ρ) of semiconductor samples

• Type of semiconductor (n-type or p-type) (optional extension)

• Temperature coefficient of resistance (if paired with a heating arrangement)

Ideal for undergraduate and postgraduate courses in solid-state physics, material science, and electronic engineering, this model provides hands-on exposure to essential characterization techniques.