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The Magnetoresistance Probe (FPA-MRX-02) is a specialized experimental setup designed to study the magnetoresistance effect in semiconductor and metallic samples. This effect refers to the change in a material's electrical resistance when exposed to an external magnetic field. The FPA-MRX-02 provides a platform for analyzing how charge carriers are influenced by magnetic fields, making it essential for advanced physics and materials science research. The system typically includes a sample holder compatible with electromagnets, precision voltage and current measurement terminals, and a platform for mounting in magnetic field zones. It is used in conjunction with a digital Gaussmeter and powerful electromagnets (not included) for complete field-dependent measurements. Key Features:
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