The Two Probe Setup (TPX-200C) is an advanced laboratory instrument designed for the precise measurement of the resistivity of semiconductors and thin film materials using the two-probe technique. This upgraded version of the TPX-200 features enhanced digital instrumentation and thermal control capabilities, enabling users to conduct resistivity studies over a range of temperatures.
The system includes a digital microvoltmeter, digital constant current source, and sample mounting arrangement with temperature-controlled heating, making it suitable for high-resistance materials and detailed temperature-dependent studies. The probes are spring-loaded and precisely aligned on a rigid platform to ensure reliable and reproducible contact with the sample surface.
Ideal for research laboratories, material science departments, and semiconductor device studies, the TPX-200C ensures accurate, high-sensitivity measurements in a compact and user-friendly design.
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