The Four Probe Setup (DFP-RM-200NC) is a research-grade, closed-chamber four-point probe system designed for high-precision resistivity measurements of semiconductors, nanomaterials, and thin films. This advanced setup supports both cryogenic (~77 K using liquid nitrogen) and controlled high-temperature (up to ~300°C) measurements, within a sealed and insulated measurement environment to reduce thermal losses and noise.

Ideal for research institutions, materials development labs, and university physics departments, the DFP-RM-200NC enables in-depth analysis of:

• Resistivity variation with temperature

• Semiconductor type identification

• Band gap energy determination

• Carrier transport behavior

🔧 Key Features:

• Closed, vacuum-compatible cryostat chamber with LN₂ port and vent

• Programmable PID temperature controller for precision heating

• Four-point probe assembly with spring-loaded, gold-plated tungsten tips

• Stable constant current source with microampere to milliampere range

• Digital nanovoltmeter for high-resolution voltage measurement

• Optional PC connectivity and data acquisition software

• Shielded connections and noise-isolated construction for accurate results

• Suitable for bulk samples, thin films, and semiconductor wafers

📚 Applications:

• Advanced temperature-dependent resistivity studies

• Band gap and activation energy calculation

• Electrical behavior of novel materials and nanostructures

• Long-term academic and industrial research in semiconductor physics